When electric elements are formed on a ceramic bar or the like, the positional displacement of the respective elements occurs due to a division exposing process or the like. Improving detector accuracy decreases missed detects and false detects. The logical state of a center bit triplet of the byte is detected. Resistive layers, each resistive layer including a first region are disposed in the first through region, a second region disposed in the second through region, and a third region disposed in the trench. Other aspects and embodiments are provided herein.