The present invention provides a pressure reducing valve having excellent responsiveness, durability, and reliability and stable output characteristics. More particularly the present invention relates to a method and system for evaluating accurately the electrical overstress or ESD performance of semiconductor devices during the voltage transition region. A material is molded at least partially over the first core and feed core. As a result, the priority of the virtual machine can be determined according to the task priority and the switching of virtual machines can be adequately controlled even if the virtual machines cannot notify the task priority. The method is based on the concept of auto-similarity and ensures that the input information is not visible but finally be retrieved without providing knowledge of the original documents.