Methods and systems for detecting wafer shiftslide in a semiconductor process chamber have been disclosed. The control device sets an operation state quantity according to the predicted current and the temperature of the fuel cell stack from a predetermined operation state quantity map that is preset. The computer-implemented method includes generating one or more graphical elements of one or more activities captured by a monitoring device. When a FCoE frame is received by the FIA, the source and destination Ethernet MAC addresses are replaced, such as where the destination Ethernet MAC address of the received matched FCoE frame is replaced by the MAC address assigned to the desired end port.