A platform for testing electronic parts and electrode used in the same for easy and accurate testing of a three-terminal device. More specifically the embodiments teach configurations of conductive connections that do not overly constrain relative motion between the connected conductive substrates. A gate electrode of the fin-type transistor is formed on at least opposed side surfaces of the projecting semiconductor region, with a gate insulating film interposed. The damping material is arranged to allow the electronic display to be suspended with respect to the cover structure, thereby protecting the electronic display against conditions of shock and vibration. The video selections are arranged by category and alphabetically on the globe. The first connector includes a first planar reinforcing locking bracket stamped from sheet metal and the second connector includes a second planar reinforcing locking bracket stamped from sheet metal and configured to mate with the first planar reinforcing locking bracket.