Techniques are provided for allowing an application program to print to a new or updated printing device on a network without the user having to perform any updates or reconfigurations that are required with conventional print drivers. The pattern inspection apparatus for inspecting a pattern to-be-inspected uses an image of the pattern to-be-inspected and data for fabricating the pattern to-be-inspected. A multiple spike, rapid thermal oxidation procedure is employed to grow a gate insulator layer on the region of semiconductor alloy, or semiconductor, exposed in the opening, with the low temperature RTO procedure, and the planarized dielectric layer overlying the sourcedrain regions, suppressing out diffusion of SDE dopants. Implants suitable for intravitreal placement also are described. The amount of relative engagement between the valve element and the support element changes as the valve element deflects.