An apparatus to test a semiconductive device includes a base plane that holds at least one heat-transfer fluid unit cell. Each time a data set is modified or newly created, flags are used to denote whether the data set needs to be copied from one storage device to the other. Furthermore, the apparatus includes a device-specific definition engine in which parameters required for the communication, function andor configuration of the electronic apparatus are stored, with the device-specific definition engine being present in a device-specific format and the parameters being able to be accessed via the control engine. The operation of the antennas may also be adaptably relocated from unused modes to in-use modes to maximize performance.