A method and apparatus for detecting contaminants in an ion-implanted wafer by annealing and activating the ion-implanted wafer by heating or charging or both, and measuring the thermal wave absorbance generated from the activated wafer. The passage layer is non-porous and has an aperture therethrough. and adhesive strength of about 600 to about 150,000 Pa and applying the matrix to a tissue defect. The MDC can be easily integrated into the air management system of a fuel cell.