A system for using a translation loop upconverter and power amplifier including a secondary phase-error correction loop uses the output of the upconverter to lock a feedback loop during a time in which the output of the power amplifier is insufficient to provide feedback to the upconverter. In the inspection method of the surface of the compound semiconductor substrate, the surface roughness Rms of the compound semiconductor substrate is measured using an atomic force microscope at the pitch of not more than 0. By controlling the microstructurenanostructure of the layers, the material properties of the composite material formed by this method can be tailored for a specific use. A probabilistic data structure is generated to indicate for which particular buckets in the histogram there is a data value stored in the data block. This continues as the member traverses up and down over the display. The diode has a first terminal electrically coupled to a bottom of the recess in the first semiconductor region.