A semiconductor device is disclosed. The signal is transmitting off the pad through non-contact couplings such inductive coupling or optical couplings after being converted into signal formats enabling non-contact transmission. The process monitor cell thereby provides an accurate estimate of the quality of the fabrication process used to generate other functional SRAM cells within the integrated circuit design. We also explain how our techniques can be exploited to achieve other results with similar properties; these include long-lived renaming and dynamic memory management for nonblocking data structures. With respect to both the third and fourth arms, a line linking one-side end portion to an intermediate pivotable portion is substantially perpendicular to a line linking the other-side end portion to the intermediate pivotable portion.