Systems andor methods are disclosed for aligning multiple layers of a multi-layer semiconductor device fabrication process andor system utilizing a composite alignment mark. The gate level description of the specification and implementation are converted to a network of elementary arithmetic 1-bit operations and the equivalence of the specification and implementation is identified in that a comparison of the resultant networks from elementary arithmetic 1-bit operations is carried out directly. The computer and the touch panel store data having plural records respectively. A second power source is coupled to the communication circuit and provides power to the communication circuit. Also in accordance with this invention, physical design tools are enhanced to read and process anisotropic design rules.