A test pattern generating unit generates a test pattern in which unconverted data is arranged such that same values of 0 or 1 bits in converted data according to a code conversion table are successively transferred to each of a plurality of serial transfer channels that a high-speed serial transfer device has. Protrusions are formed on principal surfaces of first ceramic green sheets according to at least a single thick film forming process. NMOSFETs coupled between second common nodes are grouped into one or more second classes. The terminal ends of the massaging members each are elevated into contact with the spine and assume a curve approximating the curvature of the spinal area so that a patient reclining in a supine position will gravitate into proper contact with all of the massaging members. The device also has a number of different jacket sections, preferably at least four, with increasing durometer towards the proximal end and a braided section with varying pic along the length.