The present invention concerns a method for in situ measuring of evaporation from a surface and an apparatus for measuring the evaporation from a surface. The image data input circuit includes a storage unit that stores line data of a plurality of continuous lines including line data of an input target among line data formed from pixel data corresponding to one line of the image data, and from the storage unit and corrects the pixel data of the input target on the basis of information of the peripheral pixel data. The wafers are then mounted with tape coated with a generally high level adhesive. A fractional decoder can receive a signal vector, and can find at least two nearest neighbors in each dimension.