Apparatuses and methods of an integrated capacitance model circuit are described. In this case, this system includes a detector for measuring the light coming from a single sample, and this detector has a detection direction, which lies on an optical axis that is essentially parallel to the optical axis of the light source. The method includes providing a substrate, forming a first pattern in a first region of the substrate, and forming a second pattern in a second region of the substrate, the second pattern comprising patterns for features oriented differently than patterns for features of the first pattern. The invention also relates to an antenna arrangement and base station.