Disclosed is a system, method, and computer program product for analyzing sets of data in an efficient manner, such that analytics can be effectively performed over that data. Some example devices or systems include a magnetic bearing comprising electro-actuators adapted to move permanent magnets relative to a rotor to balance the rotor. Pattern distortion amounts in the portion other than the pattern edge portion are detected by comparing the data of the layout pattern and the simulation results for the respective sampling points. Also, a semiconducting thin film, an optoelectronic device, a laser, a photovoltaic cell, a diode, a light emitting diode or a display including the colloidal material. Removed material from the first surface is monitored to detect fluctuations in a variable of composition in the layer, and removal of material from the first surface is terminated when the composition of monitored material meets a predetermined criterion. The method includes the generation of a set of DOM-type XML documents that include the non-generic logic of the application; the generic logic is associated to Java classes related to certain elements in the DOM.