A patient examination support system comprising an examination tabletop adjustable in vertical and in longitudinal directions, and a lifting structure which supports the examination tabletop. That method comprises forming a dielectric layer on a substrate, forming a trench within the dielectric layer, and forming a high-k gate dielectric layer within the trench. Responsive to determining a deviation from the baseline occurs, one or more computer processors identify an event that caused the deviation. The bracket section is mounted to the backplane.