A method and system for increasing the efficiency and reducing the time required for defect inspection of microfabricated structures such as semiconductor wafers, masks or reticles for micro-fabrication, flat panel displays, micro-electro-mechanical. This object and associated location may then be transferred to an entity for publishing the object and location on a map. The neck roll can be positioned adjacent a lower rim of the liner and can include one or more deformable impact absorption compartments to absorb the impact between the helmet and the wearer’s headneck. In a second configuration, the pin is adapted for locking engagement by pressurized downhole drilling mud, and may be disengaged from the aperture when pressure from drilling mud ceases. The determination steps, the detection step, and the application step are carried out within each entity, independently.