A standard sample for transmission electron microscopy elemental mapping and a TEM elemental mapping method using the same are provided. The back board is connected to the surface board or the reinforcing member by a connecting member 15 which is capable of losing the force of constraint against the surface board or the reinforcing member on high temperature conditions during a fire. Thereby, it is possible to provide a booster circuit that is capable of generating an output voltage, which is more than twice as high as an input voltage, and can be reduced in the size and the weight. A battery is situated in the interior area of the housing that is selectively actuated to energize the thermoelectric assembly.