A method and system for probing with electrical test signals on an integrated circuit specimen using a high resolution microscope positioned for observing a surface of the specimen exposing electrically conductive terminals thereon. The cannister also includes attachment means proximate its open end so that the cannister can be secured to a supporting frame. The shoe cover preferably contains slits which appear on the side of the shoe cover. According to a preferred embodiment, power shifters include an arrangement of back-to-back hybrid combiners having phase adjusting circuitry disposed there between.