A semiconductor device can include a channel region with a first semiconductor material for a majority carrier in the channel region during operation of the device and a metal contact. The method uses the tip of a conducting atomic force microscope to locally and reversibly switch between conducting and insulating states. The interface also includes a navigation tool having a corridor indicator that provides a diagrammatic linear representation of the linear corridor, indicia along the corridor indicator that represent critical assets, and a corridor window superimposed on the corridor indicator that slides linearly along the corridor indicator. The barrier panel is configured to be placed in a closed position that obstructs access to the one or more electrical components through the compartment door and an open position that provides access to the one or more electrical components through the compartment door. The lower trays have lower tray guides configured to interact with corresponding lower chassis guides on the lower support for aligning the lower trays to the backplane.