Dispersion of load may be kept within an allowance even when a plurality of probes in a large area are pressed in batch by pressing the probes provided in a membrane to a wafer by applying a pressure load to a plurality of places of a plane of pressure members on the side opposite from the wafer in a probe test stepburn-in test step which is one of semiconductor device manufacturing steps. An item of information to be written to the memory arrangement is written with a first address both to the first memory module and to the second memory module. The dielectric prevents the devices from being stripped by a wet oxide etch that can result in the exposure of the silicon corners. The DC-DC converter generates a desired DC voltage using the external input voltage according to a voltage control signal subject to the timing control signal. The catalyst can also includes an inflow-side partition vertically cutting and dividing the inflow space into a plurality of partial inflow spaces, and an inlet formed for each partial inflow space. Also disclosed are methods of making and using such compounds, including, but not limited to, using such compounds for treating various conditions.