A semiconductor wafer test system for carrying out a burn-in test on a semiconductor wafer including multiple semiconductor devices thereon. As a solution, a baffle in size and shape is disposed about the flow-control member and adjacent facing surfaces bound therebetween a compartment of such nominal width that splashing does not occur therein. The satellite further has a satellite receiver for receiving the satellite signal. Moreover, another embodiment comprises a bypass mechanism which bypasses signals to other components because under certain circumstances it is reasonable to bypass incoming data signals directly from one device to another.