1460825470-ffd3e5a4-e3b2-401b-9ad1-76dbc3d3f74a

In accordance with the invention, an electron beam source for exposing selected portions of a surface to electrons comprises a plurality of nanoscale electron emitters and, associated with each electron emitter, a directional control element to direct the emitter toward a selected portion of the surface. Each rail couples a pair of the upright posts. A separate wireless input device comprising a wireless transmitter for communicating with the wireless transceiver of the imaging system may comprise one or more sensors capable of detecting force and directional movement. The Faraday Cage surrounds at least a portion of the microchip.