1460833539-8b1381ff-c6b4-4b95-bdae-afad883e9d0d

The present invention provides a circuit for performing a stress test on a paired line. The first lens is bonded to the second lens by engaging the protrusion with the recess. A first differential amplifier and a second differential amplifier are connected in incoming circuit to the quadrature modulator. The desired region also can be reference marked based on the array of indices.