An integrated circuit that detects whether a through silicon via has defects or not, at a wafer level. More specifically, such a probe includes a base and a tip, and an arm extending from the base to the tip as a single continuous member. The shroud segment has an arcuate, axially extending mounting flange. The total inductance will be greatly reduced and thus allows rapid current change during the transient change. The method further includes the step of recognizing from the eye-movement patterns a plurality of eye-behavior patterns corresponding to the mental states of the person.