The disclosure discloses a method for predicting a user operation. It is another object to improve characteristics of a semiconductor element typified by a TFT by controlling a deposition process of a microcrystalline semiconductor film or a semiconductor film including crystal grains. Each of the tubes defines one or more closed compartments. The inspection device inspects a materialization state of the information contents in the terminal device based on the program and the device information and transmits a result of the inspection to the program distribution device and the contents distribution device. Various aspects of the system may be implemented as a server or a client. In some embodiments, methods are used to develop and evaluate new processes for the deposition of anti-reflection coating materials.