A speed binning test circuit for a semiconductor device may include a plurality of circuit groups arranged along a boundary of a chip circuit. The invention pertains to cell phone calls from an affiliated terminal to her \u201chome\u201d private branch exchange. When connected to a USB, a recognition control unit 32 returns a signal representing a CD-ROM in a simulated manner in response to inquiry about the type of the device from the host side. The searcher is bested by comparing keywords of the query to keywords for which the searcher has registered and a high ranking searcher may be chosen by the system based on various factor. By determining a weighted selection score from the analysis of all the information available to the data protection system, the data protection system can intelligently select a data repository for storing data from the source computing system.