A Test Station for a memory tester is comprised of one or more Test Sites that are each individually algorithmically controllable, that can each deal with as many as sixty-four channels, and that can be bonded together to form a Multi-Site Test Station of two or more Test Sites. The system also comprises a detachable hitch mounting that can be gripped by a handling machine which carries the detachable mounting and assembles it, after adjustment on the semi-trailer’s pivoting turntable. Each armrest may include a locking mechanism for holding the armrests in a use position.