A system is provided for using test structures to evaluate a fabrication of a wafer. The user may enter a form name such as channel, cell, trkgrp, trkmem, etc. This setting unit has an inner body coupled to the camshaft so as to rotate with it, and an outer body that is mounted to rotate relative to the camshaft via a drive connection which runs from a crankshaft to the camshaft. The application of fluid pressure on the molten metal causes the molten metal to supply the casting apparatus.