A film thickness measuring method and apparatus capable of measuring a film thickness with high accuracy even if the spectral reflection intensity is not sufficiently high to measure an accurate film thickness and gives a poor SN ratio. A first coupling element is provided with which each vane is coupled so as to be rotatable about a first swiveling axle. An integrated learning management system and method enforces a plurality of standards upon the ILT component and the CBT component, each said standard governing at least one of quality, uniformity and branding. The number of major defects up to a selected size is determined by the total number of single path intersections by defects up to the selected size.