A test system and a method for testing an integrated circuit determines the synchronization of the integrated circuit by a current measurement rather than conventionally in the time domain. Further, curved bight members are disposed between the cross piece member and the side members, such that the curvilinear design and the bight members co-act to provide lift and enhanced volume to a wearer’s hair style thus augmenting and enhancing the wearer’s chosen hairstyle. In the high-speed mode, the prefetched data bits are transferred in parallel to 4 parallel-to-serial converters, which transform the parallel data bits to a burst of 8 serial data bits and apply the burst to a respective one of 4 data bus terminals. If the term is found within the terms database, that indicates that the programming term is a user-defined term.