A system that incorporates teachings of the present disclosure may include, for example, a method involving a step to tune a plurality of tunable reactive elements by measuring a drift in reactance of at least one of the plurality of tunable reactive elements away from a desired reactance. The charge transport layer has a lower surface and an upper surface, wherein the lower surface is in contiguous contact with the charge generating layer. When adjacent semiconductor devices or semiconductor device components are severed from one another, the conductive material in each via between the semiconductor devices is bisected.