A system and method for processing semiconductor wafers using different wafer processes utilizes multiple processing assemblies to efficiently perform these wafer processes. In one example, the imaging transform spectrometer is configured such that the modulation used for interferometric imaging may be dynamically turned ON and OFF to select a desired mode of operation for the instrument. The antifuse structures differ in their respective geometries and materials so that a low programming voltage will blow the more sensitive fuse first, and a higher voltages will program the lesser sensitive fuses thereafter. The bypass loop includes a valve that is capable of being controlled remotely, the valve being movable from a closed position to an open position.