The present invention provides two or more test structuressubstructures that are used in a test pattern to determine a cracking threshold for a dielectric material on a substrate. The strength of this approach lies in the simplicity of double sideband subcarrier signals and the fact that these signals travel the complete optical path with the baseband signal of interest. , and low enough to avoid significant conversion of the biomass material to liquid conversion products; and forming fluidizable particles from the biomass material. The molded inserts are receivable in the apertures of the substrate and are later swaged to retain them and the contacts to the substrate.