A process for operating an optical scanning system includes making an image of a sample by scanning spots in the sample, measuring intensities of light emitted by the scanned spots, determining locations of the scanned spots, and assigning intensities to image pixels based on the measured intensities and determined locations of the scanned spots. Each configurable circuit configurably performs a set of operations. A device is described comprising a plurality of wells for isolating transistors of a plurality of voltage ranges, wherein each one of the plurality of wells contains at least one transistor of a particular voltage range, and wherein transistors of only one of the plurality of voltage ranges are within each of the plurality of wells. Such devices as p-n diode, CMOS-like circuit, bipolar transistor, light emitting diode and laser are disclosed, all of them are expected to have superior performance then their semiconductor-based counterparts due to excellent CNT electrical and optical properties.