Methods and systems for monitoring semiconductor fabrication processes are provided. The pass-through connectors easily attach to the screens to allow for a permanent pass through to exist between an interior space and an exterior space that is separated by a screen wall. At least one of the internal electrodes 23a to 23e is electrically connected to the first external electrode 31, and at least one of the internal electrodes 23a to 23e is electrically connected to the second external electrode 32. The container has a bottom underside formed in transport direction with at least one grooved recess which defines a leading edge and a trailing edge, as viewed in transport direction, with the convex and concave portions engaging only the leading and trailing edges of the container, as the container is moved between the transport planes.