A technique for machine learning, such as supervised artificial neural network learning includes receiving data and checking the dimensionality of the read data and reducing the dimensionality to enhance machine learning performance using Principal Component Analysis methodology. This can be done by implanting, on the average, a single atom of the atomic species of interest into each nanocrystal, and then measuring an electrical charge distribution on the nanocrystals with scanning capacitance microscopy or electrostatic force microscopy to identify and select those nanocrystals having exactly one atom of the atomic species of interest therein. With the above-described structure, the area the gate signal line driving circuit occupies in prior art is removed to reduce the width of the display device.