1459886571-6dd03d45-e4ac-48f8-a1dc-fb3e9b6d690f

The invention is aimed at providing a novel semi-conductor component, as well as a novel process for reading test data. The apparatus comprises a host controller providing a host function of USB interface; a device function circuit providing a device function of USB interface; at least one connection for connecting to a USB device or a USB cable by way of data transfer; and a path switch unit. A separate cover portion having a substantially planar portion overlies and is permanently secured to the substrate first portion, the EAS device being permanently sealably sandwiched between the separate cover portion and the substrate first portion. The dial has a cam service, which interacts with internal portions of the trip unit to set or calibrate the level at which a magnetic trip actuation occurs.