There is provided a semiconductor device manufacturing apparatus and a semiconductor device manufacturing method capable of recovering a damage of a low dielectric insulating film exposed to CO2 plasma to obtain the low dielectric insulating film in a good state, thus improving performance and reliability of a semiconductor device. The apparatus includes an image capture unit that is configured to capture one or more image frames. Due to these characteristics, the alloy is attractive for use in jewelry applications. The display region receives and reacts to the light signal, and the contact pressure is transformed into an electrical signal by the transducer module. The moat continuously spans the entire width of the slider.