To provide a technique capable of improving reliability of a semiconductor device having a nonvolatile memory cell by suppressing the reduction of the drive force. The switch device includes a knob operated to switch an actuation state of an apparatus. A raised portion extends from the top surface of the sheet and includes a cutting edge adapted to cut the envelope blank to form the opening. The cooling air, on the outside of the burner wall, is deflected in a directed manner in its flow direction by means of deflection elements which are in a distributed arrangement.