One embodiment of the present invention provides a system that performs a carry-save square root operation that calculates an approximation of a square root, Q, of a radicand, R. The I-EDA has a non-conforming wafer tracing system that operates to correlate occurrences of abnormal events with low wafer yield. Further, by combining the semiconductor display device with a front light, insufficient amount of light can be supplemented with the front light. The second primary support is coaxially rotatable with respect to the first primary support member. A rapid thermal process is performed on the titanium layer and the first barrier layer. The plates extend between the upper bar assemblies and the lower bars and outwardly beyond each.