An apparatus capable of measuring topography and transparent film thickness of a patterned metal-dielectric layer on a substrate without contact with the layer. A generally U-shaped cup that holds beverage and has a cover has an upper portion that fits snugly with an upper perimeter of the container and a lowest portion that extends below the surface of the water. The first conductive plate is formed of a material having a CTE that is higher than the CTE of the substrate, and is attached to a first surface of the substrate. Also, a label management program manages the labeled file in the client terminal. In addition, when the reduced picture displaying process is performed, since a wasteful picture portion is not processed, the utilization efficiency of the screen is improved. An installation for carrying out this procedure is also described.