A security system including one or more sensors for detecting a predetermined security event. The apparatus includes a projector that projects an image having a relatively high luminance, and a transmission type screen installed at an image formation plane of a projection light from the projector. The process is carried out by first mounting the test sample in a opening formed with tapered sidewalls through a die with the upper surface of the sample directly abutting the edges of the smallest portion of the tapered opening in the die, The die is then mounted in an opening with tapered sidewalls in a test wafer. The method also includes positioning a second capacitive coupling at a second time delay from the first capacitive coupling, the second time delay corresponding to an average time delay that optimizes near end crosstalk.