A stacked assembly of integrated circuit semiconductor devices includes a stack of integrated circuit semiconductor devices supported by a printed circuit board. Along with the first filter element, a second filter element is provided. The wireless access subsystem has a separate power supplier incorporated therein and operates independently from the computing product. A frusto-conical spring member having axially opposed first and second end portions is conjoined to another end portion of the shaft and extends downwardly away therefrom along a vertical plane respectively. The impaired received reference test signal may be processed with a stored reference test signal to find a time-domain impulse response from which the uncorrelated distortion energy can be measured.