A method of predicting component crack behavior in a nuclear reactor provides access to a crack growth behavior model over a global network. The peripheral circuit is one of a scanning line driver circuit, a test circuit and a precharge circuit, the scanning line driver circuit supplying a scanning signal to the unit circuits through the scanning lines, the test circuit testing the unit circuits to determine whether or not each of the unit circuits is defective, and the precharge circuit outputting a precharge signal to the data lines. As the drum rotates, all soil plugs are blended with each other.