Mark and method for integrated circuit fabrication with polarized light lithography. The method includes defining a plurality of rows in a semiconductor layer. The method includes the step of obtaining such a device, of passing the sample between the inlet aperture and the outlet aperture of the device, of subjecting the device to a reduced pressure, of making the reduced pressure cease, and then of detecting the presence of microorganisms on the membrane of the device. The pressure vessel including an auxiliary device or aid for correct positioning of the lid on the container. Secondary XML indexes may be created to assist in the search and retrieval of XML data stored in the primary table. The first region and the third region are directly bonded.