Systems and computer-readable media having computer-executable components are disclosed for generating a representation of flatness defects on a wafer. The system also having a printhead assembly positioned on a first side of the media path and spanning the width of the media path, an aerosol collection duct with an opening on the first side of the media path and a spittoon system positioned on a second side of the media path opposing the first side. In addition, a method for determining programmable coefficients to replicate frequency and supply voltage correlation is described.