A system and method is provided for testing a secondary chip housed within a multi-chip packaged semiconductor device. The device utilizes a curved spray chamber and a thermal technique to divert any desired portion of the aerosol to waste. Thus efficient processing can be realized without wasted waiting time or wasted request for data loading in the terminal, in case the data generation requires a long time. The image output control unit instructs to skip the output of both the left-eye image and the right-eye image, when the image output preparation of one of the left-eye image and the right-eye image is not completed.