It is possible to provide a semiconductor test program debug device capable of reducing the unnecessary facilities when using a semiconductor test device or a semiconductor test program of different specification. The memory card socket has a body for receiving a memory card, many pins to electrically connect to the memory card, two elastic members for holding the memory card, and a blocking member for restraining one of the two elastic members. The method includes forming a pair of gate oxides to a first thickness, which in one embodiment, includes a thickness of less than 5 nanometers. When resident in the flash memory chips, a single ALU or multiple ALUs may be used.