A semiconductor memory device may be effectively evaluated by a test that compares the phase of an internally generated control signal with the phase of an internally generated clock signal. The PAM particles are characterized by a particle size that is about 100 mesh and consisting essentially of molecules having a molecular weight of at least about 15 million a. The at least one processing device is adapted to execute a plurality of protective functions for a zone based on information of power conditions within the zone and predetermined protective requirements of the zone.