A semiconductor device test system has an interface for use with a semiconductor device test method, and a semiconductor device test method. In one embodiment, the FFTIFFT processor includes an even-odd data mapper configured to provide a mapping of the N data values into N2 mapped complex data values if the N data values are real. Upon evaluating the history of each requester, the system determines whether to delay the file-level requests from entering the file system stack based on the result of the evaluation. The method further comprises outputting the third frame as the interpolated frame at the interpolated frame time if the first absolute difference is less than or equal to a first threshold value.